Importance of dynamic faults for new SRAM technologies

S Hamdioui, R Wadsworth, JD Reyes, AJ van de Goor

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

47 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	ETW 2003; Eighth IEEE European test workshop
Editors	s.n.
Place of Publication	Piscataway
Publisher	IEEE
Pages	29-34
Number of pages	6
ISBN (Print)	0-7695-1908-3
Publication status	Published - 2003
Event	Eighth IEEE European test workshop, Maastricht, The Netherlands - Piscataway Duration: 25 May 2003 → 28 May 2003

Name
Publisher	IEEE

Conference	Eighth IEEE European test workshop, Maastricht, The Netherlands
Period	25/05/03 → 28/05/03

Keywords

@inproceedings{86c1cfd22e554789969956a668fd2558,

title = "Importance of dynamic faults for new SRAM technologies",

keywords = "Conf.proc. > 3 pag",

author = "S Hamdioui and R Wadsworth and JD Reyes and {van de Goor}, AJ",

year = "2003",

language = "Undefined/Unknown",

isbn = "0-7695-1908-3",

publisher = "IEEE",

pages = "29--34",

editor = "s.n.",

booktitle = "ETW 2003; Eighth IEEE European test workshop",

address = "United States",

note = "Eighth IEEE European test workshop, Maastricht, The Netherlands ; Conference date: 25-05-2003 Through 28-05-2003",

}

TY - GEN

T1 - Importance of dynamic faults for new SRAM technologies

AU - Hamdioui, S

AU - Wadsworth, R

AU - Reyes, JD

AU - van de Goor, AJ

PY - 2003

Y1 - 2003

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 0-7695-1908-3

SP - 29

EP - 34

BT - ETW 2003; Eighth IEEE European test workshop

A2 - s.n., null

PB - IEEE

CY - Piscataway

T2 - Eighth IEEE European test workshop, Maastricht, The Netherlands

Y2 - 25 May 2003 through 28 May 2003

ER -