Improved risk analysis through failure mode classification accoring to occurence time

RPY Mehairjan; Q Zhuang; D Djairam; JJ Smit

Improved risk analysis through failure mode classification accoring to occurence time

RPY Mehairjan, Q Zhuang, D Djairam, JJ Smit

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	Proceedings of 2012 IEEE international conference on condition monitoring and diagnosis (ICMD 2012)
Editors	Suwarno
Place of Publication	Piscataway
Publisher	IEEE
Pages	866-869
Number of pages	4
ISBN (Print)	978-1-4673-1018-5
Publication status	Published - 2012
Event	2012 IEEE international conference on condition monitoring and diagnosis (ICMD 2012), Bali, Indonesia - Piscataway Duration: 23 Sept 2012 → 27 Sept 2012

Publication series

Name
Publisher	IEEE

Conference

Conference	2012 IEEE international conference on condition monitoring and diagnosis (ICMD 2012), Bali, Indonesia
Period	23/09/12 → 27/09/12

Cite this

@inproceedings{a858c69584a141cb95b96d2e4444cebf,

title = "Improved risk analysis through failure mode classification accoring to occurence time",

author = "RPY Mehairjan and Q Zhuang and D Djairam and JJ Smit",

year = "2012",

language = "English",

isbn = "978-1-4673-1018-5",

publisher = "IEEE",

pages = "866--869",

editor = "Suwarno",

booktitle = "Proceedings of 2012 IEEE international conference on condition monitoring and diagnosis (ICMD 2012)",

address = "United States",

note = "2012 IEEE international conference on condition monitoring and diagnosis (ICMD 2012), Bali, Indonesia ; Conference date: 23-09-2012 Through 27-09-2012",

}

Mehairjan, RPY, Zhuang, Q, Djairam, D & Smit, JJ 2012, Improved risk analysis through failure mode classification accoring to occurence time. in Suwarno (ed.), Proceedings of 2012 IEEE international conference on condition monitoring and diagnosis (ICMD 2012). IEEE, Piscataway, pp. 866-869, 2012 IEEE international conference on condition monitoring and diagnosis (ICMD 2012), Bali, Indonesia, 23/09/12.

Improved risk analysis through failure mode classification accoring to occurence time. / Mehairjan, RPY; Zhuang, Q; Djairam, D et al.
Proceedings of 2012 IEEE international conference on condition monitoring and diagnosis (ICMD 2012). ed. / Suwarno. Piscataway: IEEE, 2012. p. 866-869.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Improved risk analysis through failure mode classification accoring to occurence time

AU - Mehairjan, RPY

AU - Zhuang, Q

AU - Djairam, D

AU - Smit, JJ

PY - 2012

Y1 - 2012

M3 - Conference contribution

SN - 978-1-4673-1018-5

SP - 866

EP - 869

BT - Proceedings of 2012 IEEE international conference on condition monitoring and diagnosis (ICMD 2012)

A2 - Suwarno, null

PB - IEEE

CY - Piscataway

T2 - 2012 IEEE international conference on condition monitoring and diagnosis (ICMD 2012), Bali, Indonesia

Y2 - 23 September 2012 through 27 September 2012

ER -