Improved risk analysis through failure mode classification accoring to occurence time

RPY Mehairjan, Q Zhuang, D Djairam, JJ Smit

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    Original languageEnglish
    Title of host publicationProceedings of 2012 IEEE international conference on condition monitoring and diagnosis (ICMD 2012)
    Editors Suwarno
    Place of PublicationPiscataway
    PublisherIEEE Society
    Pages866-869
    Number of pages4
    ISBN (Print)978-1-4673-1018-5
    Publication statusPublished - 2012
    Event2012 IEEE international conference on condition monitoring and diagnosis (ICMD 2012), Bali, Indonesia - Piscataway
    Duration: 23 Sep 201227 Sep 2012

    Publication series

    Name
    PublisherIEEE

    Conference

    Conference2012 IEEE international conference on condition monitoring and diagnosis (ICMD 2012), Bali, Indonesia
    Period23/09/1227/09/12

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