Improved spectral fitting of nitrogen dioxide from OMI in the 405-465 nm window

JHGM van Geffen, K.F. Boersma, M van Roozendael, F Hendrick, E Mahieu, I De Smedt, M Sneep, JP Veefkind

Research output: Contribution to journalArticleScientificpeer-review

31 Citations (Scopus)
Original languageEnglish
Pages (from-to)1685-1699
Number of pages15
JournalAtmospheric Measurement Techniques
Volume8
Issue number4
DOIs
Publication statusPublished - 2015

Keywords

  • Peer-lijst tijdschrift

Cite this

van Geffen, JHGM., Boersma, K. F., van Roozendael, M., Hendrick, F., Mahieu, E., De Smedt, I., Sneep, M., & Veefkind, JP. (2015). Improved spectral fitting of nitrogen dioxide from OMI in the 405-465 nm window. Atmospheric Measurement Techniques, 8(4), 1685-1699. https://doi.org/10.5194/amt-8-1685-2015