Improvement on MIS properties of single-grain germanium by pulsed-laser annealing

P Sun; M van der Zwan; A Arslan; E Charbon; R Ishihara

Improvement on MIS properties of single-grain germanium by pulsed-laser annealing

P Sun, M van der Zwan, A Arslan, E Charbon, R Ishihara

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	Proceedings 44th IEEE Semiconductor Interface Specialists Conference
Editors	C Young, A Demkov, P Ye
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE
Pages	1-2
Number of pages	2
Publication status	Published - 2013
Event	SISC 2013, Arlington, VA, USA - Piscataway, NJ, USA Duration: 5 Dec 2013 → 7 Dec 2013

Publication series

Name
Publisher	IEEE

Conference

Conference	SISC 2013, Arlington, VA, USA
Period	5/12/13 → 7/12/13

Cite this

@inproceedings{397e326e8bc64cb9888316f83e659559,

title = "Improvement on MIS properties of single-grain germanium by pulsed-laser annealing",

author = "P Sun and {van der Zwan}, M and A Arslan and E Charbon and R Ishihara",

year = "2013",

language = "English",

publisher = "IEEE",

pages = "1--2",

editor = "C Young and A Demkov and P Ye",

booktitle = "Proceedings 44th IEEE Semiconductor Interface Specialists Conference",

address = "United States",

note = "SISC 2013, Arlington, VA, USA ; Conference date: 05-12-2013 Through 07-12-2013",

}

Improvement on MIS properties of single-grain germanium by pulsed-laser annealing. / Sun, P; van der Zwan, M; Arslan, A et al.
Proceedings 44th IEEE Semiconductor Interface Specialists Conference. ed. / C Young; A Demkov; P Ye. Piscataway, NJ, USA: IEEE, 2013. p. 1-2.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Improvement on MIS properties of single-grain germanium by pulsed-laser annealing

AU - Sun, P

AU - van der Zwan, M

AU - Arslan, A

AU - Charbon, E

AU - Ishihara, R

PY - 2013

Y1 - 2013

UR - http://ens.ewi.tudelft.nl/pubs/charbon13sisc_sun.pdf

M3 - Conference contribution

SP - 1

EP - 2

BT - Proceedings 44th IEEE Semiconductor Interface Specialists Conference

A2 - Young, C

A2 - Demkov, A

A2 - Ye, P

PB - IEEE

CY - Piscataway, NJ, USA

T2 - SISC 2013, Arlington, VA, USA

Y2 - 5 December 2013 through 7 December 2013

ER -

Improvement on MIS properties of single-grain germanium by pulsed-laser annealing

Publication series

Conference

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