Improving the Detection of Undefined State Faults in FinFET SRAMs

G. Cardoso Medeiros, M. Fieback, Thiago Copetti, A.B. Gebregiorgis, M. Taouil, L. M. Bolzani Poehls, S. Hamdioui

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

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Engineering & Materials Science