In-pixel buried-channel source follower in CMOS image sensors exposed to X-ray radiation

C Yue, J Tan, X Wang, A Mierop, AJP Theuwissen

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

3 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings of IEEE sensors 2010
PublisherIEEE Society
Pages1649-1652
Number of pages4
ISBN (Print)978-1-4244-8168-2
Publication statusPublished - 2010
EventIEEE Sensors 2010 Conference: 9th Annual IEEE Conference on Sensors - Hilton Waikoloa Village, Waikoloa, HI, United States
Duration: 1 Nov 20104 Nov 2010
Conference number: 9
http://ewh.ieee.org/conf/sensors2010/

Conference

ConferenceIEEE Sensors 2010 Conference
CountryUnited States
CityWaikoloa, HI
Period1/11/104/11/10
Internet address

Cite this

Yue, C., Tan, J., Wang, X., Mierop, A., & Theuwissen, AJP. (2010). In-pixel buried-channel source follower in CMOS image sensors exposed to X-ray radiation. In Proceedings of IEEE sensors 2010 (pp. 1649-1652). IEEE Society.