In-situ characterization of precipation in Al-Cu thin films.

JP Lokker, AJ Bottger, GCAM Janssen, S Radelaar

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	Proceedings MRS Symposium Advanced Interconnects and Contacts.
Editors	D Edelstein, T Kikkawa, MC Öztürk, KN Tu, EJ Weitzman
Pages	471-476
Number of pages	6
Publication status	Published - 1999

Name

Name
Volume	564

Cite this

@inproceedings{df3d72161f9a4565933f334df9ec31b3,

title = "In-situ characterization of precipation in Al-Cu thin films.",

author = "JP Lokker and AJ Bottger and GCAM Janssen and S Radelaar",

year = "1999",

language = "Undefined/Unknown",

pages = "471--476",

editor = "D Edelstein and T Kikkawa and MC {\"O}zt{\"u}rk and KN Tu and EJ Weitzman",

booktitle = "Proceedings MRS Symposium Advanced Interconnects and Contacts.",

}