In-situ electrical characterization combined with simultaneous TEM observation

M Rudneva, B Gao, HSJ van der Zant, HW Zandbergen

Research output: Contribution to conference › Poster › Professional

Original language	English
Publication status	Published - 2010
Event	17th International Microscopy Congress (IMC17) - Rio de Janeiro, Brazil Duration: 19 Sept 2010 → 24 Sept 2010

Conference	17th International Microscopy Congress (IMC17)
Period	19/09/10 → 24/09/10

TU Delft

Keywords

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title = "In-situ electrical characterization combined with simultaneous TEM observation",

keywords = "other public output, Geen BTA classificatie",

author = "M Rudneva and B Gao and {van der Zant}, HSJ and HW Zandbergen",

note = "TU Delft; 17th International Microscopy Congress (IMC17) ; Conference date: 19-09-2010 Through 24-09-2010",

year = "2010",

language = "English",

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TY - CONF

T1 - In-situ electrical characterization combined with simultaneous TEM observation

AU - Rudneva, M

AU - Gao, B

AU - van der Zant, HSJ

AU - Zandbergen, HW

N1 - TU Delft

PY - 2010

Y1 - 2010

KW - other public output

KW - Geen BTA classificatie

M3 - Poster

T2 - 17th International Microscopy Congress (IMC17)

Y2 - 19 September 2010 through 24 September 2010

ER -