In-situ electrical characterization combined with simultaneous TEM observation

M Rudneva, B Gao, HSJ van der Zant, HW Zandbergen

    Research output: Contribution to conferencePosterProfessional

    Original languageEnglish
    Publication statusPublished - 2010
    Event17th International Microscopy Congress (IMC17) - Rio de Janeiro, Brazil
    Duration: 19 Sep 201024 Sep 2010


    Conference17th International Microscopy Congress (IMC17)

    Bibliographical note

    TU Delft


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