In situ electrical characterization of tapered InAs nanowires in a transmission electron microscope with ohmic contacts

C Zhang, M Neklyudova, L Fang, Q Xu, H Wang, FD Tichelaar, HW Zandbergen

    Research output: Contribution to journalArticleScientificpeer-review

    4 Citations (Scopus)

    Fingerprint

    Dive into the research topics of 'In situ electrical characterization of tapered InAs nanowires in a transmission electron microscope with ohmic contacts'. Together they form a unique fingerprint.

    Material Science

    INIS

    Chemical Engineering

    Engineering