In situ imaging of electromigration-induced nanogap formation by transmission electron microscopy

HB Heersche, G Lientschnig, K O'Neill, HSJ van der Zant, HW Zandbergen

    Research output: Contribution to journalArticleScientificpeer-review

    89 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)72107-1-72107-3
    JournalApplied Physics Letters
    Issue number7
    Publication statusPublished - 2007


    • academic journal papers
    • CWTS JFIS >= 2.00

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