TY - JOUR
T1 - In Situ Spectroelectrochemical Determination of Energy Levels and Energy Level Offsets in Quantum-Dot Heterojunctions
AU - Boehme, Simon C.
AU - Vanmaekelbergh, Daniël
AU - Evers, Wiel H.
AU - Siebbeles, Laurens D A
AU - Houtepen, Arjan J.
PY - 2016/3/17
Y1 - 2016/3/17
N2 - Charge transfer in semiconductor heterojunctions is largely governed by the offset in the energy levels of the constituent materials. Unfortunately, literature values for such energy level offsets vary widely and are usually based on energy levels of the individual materials rather than of actual heterojunctions. Here we present a new method to determine absolute energy levels and energy level offsets in situ for films containing CdSe and PbSe quantum dots. Using spectroelectrochemistry, we find a type I offset at the CdSe-PbSe heterojunction. Whereas the energy level offset follows the expected size-dependent trend, the absolute positions of the 1Se level in the individual CdSe or PbSe quantum dots does not. This level varies by more than 0.5 eV, depending on film composition and surface defect concentration. Rather than extrapolating energy level offsets from measurements on pure CdSe or PbSe quantum-dot films, we suggest measuring energy level offsets in heterojunctions in situ.
AB - Charge transfer in semiconductor heterojunctions is largely governed by the offset in the energy levels of the constituent materials. Unfortunately, literature values for such energy level offsets vary widely and are usually based on energy levels of the individual materials rather than of actual heterojunctions. Here we present a new method to determine absolute energy levels and energy level offsets in situ for films containing CdSe and PbSe quantum dots. Using spectroelectrochemistry, we find a type I offset at the CdSe-PbSe heterojunction. Whereas the energy level offset follows the expected size-dependent trend, the absolute positions of the 1Se level in the individual CdSe or PbSe quantum dots does not. This level varies by more than 0.5 eV, depending on film composition and surface defect concentration. Rather than extrapolating energy level offsets from measurements on pure CdSe or PbSe quantum-dot films, we suggest measuring energy level offsets in heterojunctions in situ.
UR - http://resolver.tudelft.nl/uuid:eb97947f-95b1-402a-ba3f-ac965f693135
UR - http://www.scopus.com/inward/record.url?scp=84961171417&partnerID=8YFLogxK
U2 - 10.1021/acs.jpcc.5b12016
DO - 10.1021/acs.jpcc.5b12016
M3 - Article
AN - SCOPUS:84961171417
SN - 1932-7447
VL - 120
SP - 5164
EP - 5173
JO - The Journal of Physical Chemistry C
JF - The Journal of Physical Chemistry C
IS - 9
ER -