In-situ study of glass transition dynamics of ultra-thin-H-bonding liquid layers during molecular beam deposition by dielectric relaxation spectroscopy

M Wübbenhorst; G Couderc; NR Behrnd; J Hulliger

In-situ study of glass transition dynamics of ultra-thin-H-bonding liquid layers during molecular beam deposition by dielectric relaxation spectroscopy

M Wübbenhorst, G Couderc, NR Behrnd, J Hulliger

Research output: Contribution to conference › Poster › Professional

Original language	Undefined/Unknown
Publication status	Published - 2004
Event	3rd International Conference on Broadband Dielectric Spectroscopy and its Applications - Delft Duration: 23 Aug 2004 → 26 Aug 2004

Conference

Conference	3rd International Conference on Broadband Dielectric Spectroscopy and its Applications
Period	23/08/04 → 26/08/04

Keywords

Geen BTA classificatie

Cite this

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title = "In-situ study of glass transition dynamics of ultra-thin-H-bonding liquid layers during molecular beam deposition by dielectric relaxation spectroscopy",

keywords = "Geen BTA classificatie",

author = "M W{\"u}bbenhorst and G Couderc and NR Behrnd and J Hulliger",

year = "2004",

language = "Undefined/Unknown",

note = "3rd International Conference on Broadband Dielectric Spectroscopy and its Applications ; Conference date: 23-08-2004 Through 26-08-2004",

}

In-situ study of glass transition dynamics of ultra-thin-H-bonding liquid layers during molecular beam deposition by dielectric relaxation spectroscopy. / Wübbenhorst, M; Couderc, G; Behrnd, NR et al.
2004. Poster session presented at 3rd International Conference on Broadband Dielectric Spectroscopy and its Applications.

Research output: Contribution to conference › Poster › Professional

TY - CONF

T1 - In-situ study of glass transition dynamics of ultra-thin-H-bonding liquid layers during molecular beam deposition by dielectric relaxation spectroscopy

AU - Wübbenhorst, M

AU - Couderc, G

AU - Behrnd, NR

AU - Hulliger, J

PY - 2004

Y1 - 2004

KW - Geen BTA classificatie

M3 - Poster

T2 - 3rd International Conference on Broadband Dielectric Spectroscopy and its Applications

Y2 - 23 August 2004 through 26 August 2004

ER -