In situ TEM and STEM studies of reversible electromigration in thin palladium-platinum bridges

T Kozlova, M Rudneva, HW Zandbergen

    Research output: Contribution to journalArticleScientificpeer-review


    We investigated the reversible electromigration in Pd-Pt nanobridges by means of in situ electron microscopy. Real-time nanometer-scale imaging with scanning transmission electron microscopy was used to determine the material transport. For high current densities (3-5 x 10(7) A cm(-2)), material transport occurs from the cathode towards the anode side, indicating a negative effective charge. The electromigration is dominated by atom diffusion at grain boundaries on the free surface. The reversal of material transport upon a change of the electric field direction could be the basis of a memristor.
    Original languageEnglish
    Pages (from-to)1-7
    Number of pages7
    Issue number50
    Publication statusPublished - 2013

    Cite this