Abstract
We investigated the reversible electromigration in Pd-Pt nanobridges by means of in situ electron microscopy. Real-time nanometer-scale imaging with scanning transmission electron microscopy was used to determine the material transport. For high current densities (3-5 x 10(7) A cm(-2)), material transport occurs from the cathode towards the anode side, indicating a negative effective charge. The electromigration is dominated by atom diffusion at grain boundaries on the free surface. The reversal of material transport upon a change of the electric field direction could be the basis of a memristor.
| Original language | English |
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| Pages (from-to) | 1-7 |
| Number of pages | 7 |
| Journal | Nanotechnology |
| Volume | 24 |
| Issue number | 50 |
| DOIs | |
| Publication status | Published - 2013 |