In-situ TEM studies of the electromigration process in a single InAs nanowire

M Neklyudova, HW Zandbergen

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    Original languageEnglish
    Title of host publicationProceedings 18th International Microscopy Congress
    EditorsP Hozak
    Place of PublicationPrague, Czech Republic
    PublisherCzechoslovak Microscopy Society
    Pages1-2
    Number of pages2
    ISBN (Print)978-80-260-6720-7
    Publication statusPublished - 2014
    Event18th International Microscopy Congress - Prague, Czech Republic
    Duration: 7 Sep 201412 Sep 2014

    Publication series

    Name
    PublisherCzechoslovak Microscopy Society

    Conference

    Conference18th International Microscopy Congress
    Period7/09/1412/09/14

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