In-situ TEM study of grain boundary migration in ordered Cu3Au.

H Mohdadi, FD Tichelaar, HW Zandbergen

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	Nederlandse Vereniging voor Microscopy, Jaarboek 2000 and proceedings of the Joint Meeting.
Publisher	NVvM/BVM
Pages	162-163
Number of pages	2
Publication status	Published - 2000

Name
Publisher	NVvM/BVM

ISSN: 1389-5362

Keywords

@inproceedings{b2433f0a4e154d278e4661d489e0a34c,

title = "In-situ TEM study of grain boundary migration in ordered Cu3Au.",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "H Mohdadi and FD Tichelaar and HW Zandbergen",

note = "ISSN: 1389-5362",

year = "2000",

language = "Undefined/Unknown",

publisher = "NVvM/BVM",

pages = "162--163",

booktitle = "Nederlandse Vereniging voor Microscopy, Jaarboek 2000 and proceedings of the Joint Meeting.",

}

TY - GEN

T1 - In-situ TEM study of grain boundary migration in ordered Cu3Au.

AU - Mohdadi, H

AU - Tichelaar, FD

AU - Zandbergen, HW

N1 - ISSN: 1389-5362

PY - 2000

Y1 - 2000

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SP - 162

EP - 163

BT - Nederlandse Vereniging voor Microscopy, Jaarboek 2000 and proceedings of the Joint Meeting.

PB - NVvM/BVM

ER -