In-situ TEM study of grain boundary migration in ordered Cu3Au.

H Mohdadi, FD Tichelaar, HW Zandbergen

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

    Original languageUndefined/Unknown
    Title of host publicationNederlandse Vereniging voor Microscopy, Jaarboek 2000 and proceedings of the Joint Meeting.
    PublisherNVvM/BVM
    Pages162-163
    Number of pages2
    Publication statusPublished - 2000

    Publication series

    Name
    PublisherNVvM/BVM

    Keywords

    • ZX Int.klas.verslagjaar < 2002

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