In situ transmission electron microscope formation of a single-crystalline Bi film on an amorphous substrate

M. Neklyudova, C. Sabater, A. K. Erdamar, J. M. Van Ruitenbeek, H. W. Zandbergen

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Abstract

We have performed a range of in situ heating experiments of polycrystalline Bi films of 22-25 nm-thickness in a transmission electron microscope (TEM). This shows that it is possible to locally transform a polycrystalline thin film into a [111]-oriented single-crystalline film, whereby the unique feature is that the original thickness of the film is maintained, and the substrate used in our experiments is amorphous. The single-crystalline areas have been created by heating the Bi film to temperatures close to the melting temperature with additional heating by focusing of the electron beam (e-beam), which results in local melting of the film. The film does not collapse by dewetting, and upon subsequent cooling, the film transforms into a single-crystalline [111] oriented area. The observed phenomenon is attributed to the presence of a thin Bi-oxide layer on top of Bi film. We show that removal of the Bi-oxide layer by heating the film in a H2 gas atmosphere results in changes in the Bi film thickness and dewetting upon in situ heating in the TEM.

Original languageEnglish
Article number103101
Number of pages5
JournalApplied Physics Letters
Volume110
Issue number10
DOIs
Publication statusPublished - 6 Mar 2017

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