In Situ Transmission Electron Microscopy Imaging of Electromigration in Platinum Nanowires

M Rudneva, B Gao, F Prins, Q Xu, HSJ van der Zant, HW Zandbergen

    Research output: Contribution to journalArticleScientificpeer-review

    8 Citations (Scopus)

    Abstract

    In situ transmission electron microscopy was performed on the electromigration in platinum (Pt) nanowires (14 nm thick, 200 nm wide, and 300 nm long) with and without feedback control. Using the feedback control mode, symmetric electrodes are obtained and the gap usually forms at the center of the Pt nanowire. Without feedback control, asymmetric electrodes are formed, and the gap can occur at any position along the wire. The three-dimensional gap geometries of the electrodes in the Pt nanowire were determined using high-angle annular dark-field scanning transmission electron microscopy; the thickness of the nanowire is reduced from 14 nm to only a few atoms at the edge with a gap of about 5¿10 nm.
    Original languageEnglish
    Pages (from-to)43-48
    Number of pages6
    JournalMicroscopy and Microanalysis
    Volume19
    DOIs
    Publication statusPublished - 2013

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