Inaccuracies in the dielectric permittivity due to thickness variation

R Kochetov; IA Tsekmes; PHF Morshuis; JJ Smit

doi:10.1109/EIC.2014.6869346

Inaccuracies in the dielectric permittivity due to thickness variation

R Kochetov, IA Tsekmes, PHF Morshuis, JJ Smit

Electrical Engineering, Mathematics and Computer Science

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

4 Citations (Scopus)

Original language	English
Title of host publication	Proceedings of the 32nd Electrical Insulation Conference
Editors	PC Gaberson
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE Society
Pages	55-58
Number of pages	4
ISBN (Print)	978-1-4799-2787-6
DOIs	https://doi.org/10.1109/EIC.2014.6869346
Publication status	Published - 2014
Event	EIC 2014, Philadelphia, PA, USA - Piscataway, NJ, USA Duration: 8 Jun 2014 → 11 Jun 2014

Publication series

Name
Publisher	IEEE

Conference

Conference	EIC 2014, Philadelphia, PA, USA
Period	8/06/14 → 11/06/14

Bibliographical note

Harvest

Access to Document

10.1109/EIC.2014.6869346

Cite this

@inproceedings{184b527ca31342dcbf447146d6beccd1,

title = "Inaccuracies in the dielectric permittivity due to thickness variation",

author = "R Kochetov and IA Tsekmes and PHF Morshuis and JJ Smit",

note = "Harvest; EIC 2014, Philadelphia, PA, USA ; Conference date: 08-06-2014 Through 11-06-2014",

year = "2014",

doi = "10.1109/EIC.2014.6869346",

language = "English",

isbn = "978-1-4799-2787-6",

publisher = "IEEE Society",

pages = "55--58",

editor = "PC Gaberson",

booktitle = "Proceedings of the 32nd Electrical Insulation Conference",

}

Inaccuracies in the dielectric permittivity due to thickness variation. / Kochetov, R; Tsekmes, IA; Morshuis, PHF et al.
Proceedings of the 32nd Electrical Insulation Conference. ed. / PC Gaberson. Piscataway, NJ, USA: IEEE Society, 2014. p. 55-58.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Inaccuracies in the dielectric permittivity due to thickness variation

AU - Kochetov, R

AU - Tsekmes, IA

AU - Morshuis, PHF

AU - Smit, JJ

N1 - Harvest

PY - 2014

Y1 - 2014

U2 - 10.1109/EIC.2014.6869346

DO - 10.1109/EIC.2014.6869346

M3 - Conference contribution

SN - 978-1-4799-2787-6

SP - 55

EP - 58

BT - Proceedings of the 32nd Electrical Insulation Conference

A2 - Gaberson, PC

PB - IEEE Society

CY - Piscataway, NJ, USA

T2 - EIC 2014, Philadelphia, PA, USA

Y2 - 8 June 2014 through 11 June 2014

ER -