Inaccuracies in the dielectric permittivity due to thickness variation

R Kochetov, IA Tsekmes, PHF Morshuis, JJ Smit

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

4 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings of the 32nd Electrical Insulation Conference
EditorsPC Gaberson
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages55-58
Number of pages4
ISBN (Print)978-1-4799-2787-6
DOIs
Publication statusPublished - 2014
EventEIC 2014, Philadelphia, PA, USA - Piscataway, NJ, USA
Duration: 8 Jun 201411 Jun 2014

Publication series

Name
PublisherIEEE

Conference

ConferenceEIC 2014, Philadelphia, PA, USA
Period8/06/1411/06/14

Cite this

Kochetov, R., Tsekmes, IA., Morshuis, PHF., & Smit, JJ. (2014). Inaccuracies in the dielectric permittivity due to thickness variation. In PC. Gaberson (Ed.), Proceedings of the 32nd Electrical Insulation Conference (pp. 55-58). IEEE Society. https://doi.org/10.1109/EIC.2014.6869346