@inproceedings{532daf2ad81c4f88b754350cb3405a83,
title = "Incorporating Parameter Variations in BTI Impact on Nano-scale Logical Gates Analysis",
author = "MSK Seyab and S Hamdioui and H Kukner and P Raghavan and F Catthoor",
year = "2012",
language = "English",
publisher = "IEEE Society",
pages = "1--6",
editor = "s.n.",
booktitle = "IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems",
note = "DFT 2012/Austin USA ; Conference date: 03-10-2012 Through 05-10-2012",
}