Increasing the reliability of solid state lighting systems via self healing approaches: a review

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	English
Pages (from-to)	71-89
Number of pages	19
Journal	Microelectronics Reliability
Volume	52
Issue number	1
DOIs	https://doi.org/10.1016/j.microrel.2011.08.013
Publication status	Published - 2012

Keywords

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title = "Increasing the reliability of solid state lighting systems via self healing approaches: a review",

keywords = "CWTS JFIS < 0.75",

author = "UL Lafont and {van Zeijl}, HW and {van der Zwaag}, S",

year = "2012",

doi = "10.1016/j.microrel.2011.08.013",

language = "English",

volume = "52",

pages = "71--89",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Elsevier",

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}

TY - JOUR

T1 - Increasing the reliability of solid state lighting systems via self healing approaches: a review

AU - Lafont, UL

AU - van Zeijl, HW

AU - van der Zwaag, S

PY - 2012

Y1 - 2012

KW - CWTS JFIS < 0.75

U2 - 10.1016/j.microrel.2011.08.013

DO - 10.1016/j.microrel.2011.08.013

M3 - Article

SN - 0026-2714

VL - 52

SP - 71

EP - 89

JO - Microelectronics Reliability

JF - Microelectronics Reliability

IS - 1

ER -