Industrial applications of moisture-related reliability problems

WD van Driel, D Yang, CA Yuan, GQ Zhang

Research output: Chapter in Book/Conference proceedings/Edited volume › Chapter › Scientific

Original language	English
Title of host publication	Moisture Sensitivity of Plastic Packages of IC Devices
Editors	XJ Fan, E Suhir
Place of Publication	New York Dordrecht Heidelberg London
Publisher	Springer
Pages	411-434
Number of pages	555
ISBN (Print)	978-1-4419-5718-4
Publication status	Published - 2010

Keywords

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title = "Industrial applications of moisture-related reliability problems",

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author = "{van Driel}, WD and D Yang and CA Yuan and GQ Zhang",

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AU - Yang, D

AU - Yuan, CA

AU - Zhang, GQ

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KW - Boekdeel internat.wet

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BT - Moisture Sensitivity of Plastic Packages of IC Devices

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A2 - Suhir, E

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CY - New York Dordrecht Heidelberg London

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