Industrial evaluation of DRAM tests

AJ van de Goor Ph D, J de Neef

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

35 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationProceedings
Editors D Borrione, R Ernst
Place of PublicationLos Alamitos
PublisherIEEE
Pages623-630
Number of pages8
ISBN (Print)0-7695-0078-1
Publication statusPublished - 1999
EventDesign, Automation and Test in Europe Conference and Exhibition 1999, Munich - Los Alamitos
Duration: 13 Mar 200116 Mar 2001

Publication series

Name
PublisherIEEE Computer Society

Conference

ConferenceDesign, Automation and Test in Europe Conference and Exhibition 1999, Munich
Period13/03/0116/03/01

Keywords

  • ZX Int.klas.verslagjaar < 2002

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