Industrial evaluation of DRAM tests

AJ van de Goor Ph D, J de Neef

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

37 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	Proceedings
Editors	D Borrione, R Ernst
Place of Publication	Los Alamitos
Publisher	IEEE
Pages	623-630
Number of pages	8
ISBN (Print)	0-7695-0078-1
Publication status	Published - 1999
Event	Design, Automation and Test in Europe Conference and Exhibition 1999, Munich - Los Alamitos Duration: 13 Mar 2001 → 16 Mar 2001

Name
Publisher	IEEE Computer Society

Conference	Design, Automation and Test in Europe Conference and Exhibition 1999, Munich
Period	13/03/01 → 16/03/01

Keywords

@inproceedings{b94e95a3b0314387baa0545c3666ca0e,

title = "Industrial evaluation of DRAM tests",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "{van de Goor Ph D}, AJ and {de Neef}, J",

year = "1999",

language = "Undefined/Unknown",

isbn = "0-7695-0078-1",

publisher = "IEEE",

pages = "623--630",

editor = "{D Borrione} and {R Ernst}",

booktitle = "Proceedings",

address = "United States",

note = "Design, Automation and Test in Europe Conference and Exhibition 1999, Munich ; Conference date: 13-03-2001 Through 16-03-2001",

}

TY - GEN

T1 - Industrial evaluation of DRAM tests

AU - van de Goor Ph D, AJ

AU - de Neef, J

PY - 1999

Y1 - 1999

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SN - 0-7695-0078-1

SP - 623

EP - 630

BT - Proceedings

A2 - D Borrione, null

A2 - R Ernst, null

PB - IEEE

CY - Los Alamitos

T2 - Design, Automation and Test in Europe Conference and Exhibition 1999, Munich

Y2 - 13 March 2001 through 16 March 2001

ER -