@inproceedings{b94e95a3b0314387baa0545c3666ca0e,
title = "Industrial evaluation of DRAM tests",
keywords = "ZX Int.klas.verslagjaar < 2002",
author = "{van de Goor Ph D}, AJ and {de Neef}, J",
year = "1999",
language = "Undefined/Unknown",
isbn = "0-7695-0078-1",
publisher = "IEEE",
pages = "623--630",
editor = "{D Borrione} and {R Ernst}",
booktitle = "Proceedings",
address = "United States",
note = "Design, Automation and Test in Europe Conference and Exhibition 1999, Munich ; Conference date: 13-03-2001 Through 16-03-2001",
}