@inproceedings{9f54967ee9914ff99e4d5594df711501,
title = "Influence of bit line twisting on the faulty behavior or DRAMs",
keywords = "conference contrib. refereed, Conf.proc. > 3 pag",
author = "Z Al-Ars and M Herzog and I Schanstra and {van de Goor}, AJ",
year = "2004",
language = "Undefined/Unknown",
isbn = "0-7695-2193-2",
publisher = "IEEE ",
pages = "32--37",
editor = "FM Titsworth",
booktitle = "Records of the 2004 International workshop on Memory Technology, Design and Testing MTDT 2004",
address = "United States",
note = "2004 International workshop on Memory Technology, Design and Technology, San Jose, USA ; Conference date: 09-08-2004 Through 10-08-2004",
}