Influence of defocus on measurements in microscope images

SL Ellenberger

Research output: ThesisDissertation (TU Delft)

Original languageUndefined/Unknown
QualificationDoctor of Philosophy
Awarding Institution
  • Delft University of Technology
Supervisors/Advisors
  • Young, I.T., Supervisor
  • van Vliet, L.J., Advisor
Award date20 Jun 2000
Print ISBNs90-9013859-5
Publication statusPublished - 2000

Keywords

  • other publications
  • ZX Int.klas.verslagjaar < 2002

Cite this