Influence of defocus on measurements in microscope images

SL Ellenberger

    Research output: ThesisDissertation (TU Delft)

    Original languageUndefined/Unknown
    QualificationDoctor of Philosophy
    Awarding Institution
    • Delft University of Technology
    Supervisors/Advisors
    • Young, I.T., Supervisor
    • van Vliet, L.J., Advisor
    Award date20 Jun 2000
    Print ISBNs90-9013859-5
    Publication statusPublished - 2000

    Keywords

    • other publications
    • ZX Int.klas.verslagjaar < 2002

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