Influence of film growth conditions on the transport properties of YBa2Cu3O7-δ step-edge junctions

F. G. Hill*, M. Getta, M. A. Hein, G. Müller, H. Piel, B. Dam, S. Beuven, J. Schubert, W. Zander

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

In order to investigate the influence of film growth conditions on the transport properties of step-edge junctions, YBa2Cu3O7-δ films were deposited on high-quality substrate steps by DC-sputtering at two different substrate temperatures and by off-axis laser ablation. RSJ-like junction properties and a low (1σ)-spread of the critical current density Jc (4.2 K) of 17% along one step were obtained for laserablated junctions. The transport properties of the differently prepared junctions correlated with the microstructure of the step region. This, in turn, might result from the large differences in surface diffusion during film growth.

Original languageEnglish
Pages (from-to)249-254
Number of pages6
JournalApplied Superconductivity
Volume5
Issue number7-12
DOIs
Publication statusPublished - 1997

Bibliographical note

Funding Information:
The authors wish to thank C. L. Jia for the TEM analysis and B. Aschermann, A. I. Braginski, S. Hensen and M. Lorenz for valuable support. This work has been funded by the German BMBF (13N6418).

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