Influence of terrestrial cosmic rays on the reliability of CCD image sensors-pat 2:experiments at elevated temperature

Research output: Contribution to journalArticleScientific

26 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)2324-2328
Number of pages5
JournalIEEE Transactions on Electron Devices
Volume55
Issue number9
Publication statusPublished - 2008

Keywords

  • professional journal papers
  • CWTS 0.75 <= JFIS < 2.00

Cite this