Influence of terrestrial cosmic rays on the reliability of CCD image sensors-pat 2:experiments at elevated temperature

Research output: Contribution to journal › Article › Scientific

Original language	Undefined/Unknown
Pages (from-to)	2324-2328
Number of pages	5
Journal	IEEE Transactions on Electron Devices
Volume	55
Issue number	9
Publication status	Published - 2008

Keywords

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title = "Influence of terrestrial cosmic rays on the reliability of CCD image sensors-pat 2:experiments at elevated temperature",

keywords = "professional journal papers, CWTS 0.75 <= JFIS < 2.00",

author = "AJP Theuwissen",

year = "2008",

language = "Undefined/Unknown",

volume = "55",

pages = "2324--2328",

journal = "IEEE Transactions on Electron Devices",

issn = "0018-9383",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

number = "9",

}

TY - JOUR

T1 - Influence of terrestrial cosmic rays on the reliability of CCD image sensors-pat 2:experiments at elevated temperature

AU - Theuwissen, AJP

PY - 2008

Y1 - 2008

KW - professional journal papers

KW - CWTS 0.75 <= JFIS < 2.00

M3 - Article

SN - 0018-9383

VL - 55

SP - 2324

EP - 2328

JO - IEEE Transactions on Electron Devices

JF - IEEE Transactions on Electron Devices

IS - 9

ER -