Influence of Test Capacitor Features on Piezoelectric and Dielectric Measurement of Ferroelectric Films

Z. Wang, GK Lau, W Zhu, C. Chao

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Pages (from-to)	15-22
Number of pages	8
Journal	IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control
Volume	53
Issue number	1
Publication status	Published - 2006

Keywords

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title = "Influence of Test Capacitor Features on Piezoelectric and Dielectric Measurement of Ferroelectric Films",

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T1 - Influence of Test Capacitor Features on Piezoelectric and Dielectric Measurement of Ferroelectric Films

AU - Wang, Z.

AU - Lau, GK

AU - Zhu, W

AU - Chao, C.

PY - 2006

Y1 - 2006

KW - academic journal papers

KW - CWTS 0.75 <= JFIS < 2.00

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JO - IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control

JF - IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control

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