Influence of Test Capacitor Features on Piezoelectric and Dielectric Measurement of Ferroelectric Films

Z. Wang, GK Lau, W Zhu, C. Chao

Research output: Contribution to journalArticleScientificpeer-review

18 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)15-22
Number of pages8
JournalIEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control
Volume53
Issue number1
Publication statusPublished - 2006

Keywords

  • academic journal papers
  • CWTS 0.75 <= JFIS < 2.00

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