Influence of the gate leakage current on the stability of organic single-crystal field-effect transistors

RWI de Boer, NN Iosad, AF Stassen, TM Klapwijk, AF Morpurgo

    Research output: Contribution to journalArticleScientificpeer-review

    52 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)032103-1-032103-3
    JournalApplied Physics Letters
    Issue number3
    Publication statusPublished - 2005


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