Integral impact of BTI and voltage temperature variation on SRAM sense amplifier

IO Agbo, M Taouil, S Hamdioui, H Kukner, P Weckx, P Raghavan, F Catthoor

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

8 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings - 33rd IEEE VLSI Test Symposium
EditorsC Thibeault, L Anghel
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages1-6
Number of pages6
ISBN (Print)978-1-4799-7597-6
DOIs
Publication statusPublished - 2015
EventVTS 2015, Napa, CA, USA - Piscataway, NJ, USA
Duration: 27 Apr 201529 Apr 2015

Publication series

Name
PublisherIEEE

Conference

ConferenceVTS 2015, Napa, CA, USA
Period27/04/1529/04/15

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