Integrated optical and charged particle inspection apparatus

J.P. Hoogenboom (Inventor), Sander den Hoedt (Inventor)

Research output: Patent

Original languageEnglish
Patent numberUS 11742173 B2
IPCH01J
Priority date24/09/20
Publication statusPublished - 2023

Bibliographical note

Patent: OCT-19-016
Applicant: DELMIC B.V.

Cite this