Integrated polarization analyzing CMOS image sensor

M Sarkar; D San Segundo Bello; C van Hoof; AJP Theuwissen

doi:10.1109/ISCAS.2010.5537516

Integrated polarization analyzing CMOS image sensor

M Sarkar, D San Segundo Bello, C van Hoof, AJP Theuwissen

Electronic Instrumentation

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

13 Citations (Scopus)

Original language	English
Title of host publication	Proceedings of 2010 IEEE International Symposium on Circuits and Systems
Editors	A Amara et al.
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE
Pages	621-624
Number of pages	4
ISBN (Print)	978-1-4244-5308-5
DOIs	https://doi.org/10.1109/ISCAS.2010.5537516
Publication status	Published - 2010
Event	International symposium on circuits and systems: International Symposium on Circuits and Systems - Nano-bio Circuitfabrics and Systems - Los Alamitos, CA, USA, Paris, France Duration: 30 May 2010 → 2 Jun 2010

Publication series

Name
Publisher	IEEE

Conference

Conference	International symposium on circuits and systems
Country/Territory	France
City	Paris
Period	30/05/10 → 2/06/10

Keywords

conference contrib. non-refer.
Conf.proc. > 3 pag

Access to Document

10.1109/ISCAS.2010.5537516

Cite this

@inproceedings{a8aae32f3b534e81bdee05d9c3150eac,

title = "Integrated polarization analyzing CMOS image sensor",

keywords = "conference contrib. non-refer., Conf.proc. > 3 pag",

author = "M Sarkar and {San Segundo Bello}, D and {van Hoof}, C and AJP Theuwissen",

year = "2010",

doi = "10.1109/ISCAS.2010.5537516",

language = "English",

isbn = "978-1-4244-5308-5",

publisher = "IEEE",

pages = "621--624",

editor = "{Amara et al.}, A",

booktitle = "Proceedings of 2010 IEEE International Symposium on Circuits and Systems",

address = "United States",

note = "International symposium on circuits and systems : International Symposium on Circuits and Systems - Nano-bio Circuitfabrics and Systems ; Conference date: 30-05-2010 Through 02-06-2010",

}

Sarkar, M, San Segundo Bello, D, van Hoof, C & Theuwissen, AJP 2010, Integrated polarization analyzing CMOS image sensor. in A Amara et al. (ed.), Proceedings of 2010 IEEE International Symposium on Circuits and Systems. IEEE, Piscataway, NJ, USA, pp. 621-624, International symposium on circuits and systems, Paris, France, 30/05/10. https://doi.org/10.1109/ISCAS.2010.5537516

Integrated polarization analyzing CMOS image sensor. / Sarkar, M; San Segundo Bello, D; van Hoof, C et al.
Proceedings of 2010 IEEE International Symposium on Circuits and Systems. ed. / A Amara et al. Piscataway, NJ, USA: IEEE, 2010. p. 621-624.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Integrated polarization analyzing CMOS image sensor

AU - Sarkar, M

AU - San Segundo Bello, D

AU - van Hoof, C

AU - Theuwissen, AJP

PY - 2010

Y1 - 2010

KW - conference contrib. non-refer.

KW - Conf.proc. > 3 pag

U2 - 10.1109/ISCAS.2010.5537516

DO - 10.1109/ISCAS.2010.5537516

M3 - Conference contribution

SN - 978-1-4244-5308-5

SP - 621

EP - 624

BT - Proceedings of 2010 IEEE International Symposium on Circuits and Systems

A2 - Amara et al., A

PB - IEEE

CY - Piscataway, NJ, USA

T2 - International symposium on circuits and systems

Y2 - 30 May 2010 through 2 June 2010

ER -