Integrated silicon infrared microspectrometers

SH Kong; G de Graaf; RF Wolffenbuttel

Integrated silicon infrared microspectrometers

Electronic Instrumentation

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	Optoelectronics of Group-IV-Based Materials
Editors	T Gregorkiewicz, RG Elliman, PM Fauchet, JA Hutchby
Place of Publication	Warrendale, USA
Publisher	Materials Research Society
Pages	1-10
Number of pages	10
ISBN (Print)	1-55899-707-5
Publication status	Published - 2003
Event	Spring Meeting Optoelectronicsof Group-IV-Based Materials, San Francisco, USA - Warrendale, USA Duration: 21 Apr 2003 → 25 Apr 2003

Publication series

Name
Publisher	Materials Research Society

Conference

Conference	Spring Meeting Optoelectronicsof Group-IV-Based Materials, San Francisco, USA
Period	21/04/03 → 25/04/03

Bibliographical note

CD-ROM

Keywords

Elektrotechniek
Techniek
Conf.proc. > 3 pag

Cite this

@inproceedings{eb23f5ade85948ad90b569b091d1bc03,

title = "Integrated silicon infrared microspectrometers",

keywords = "Elektrotechniek, Techniek, Conf.proc. > 3 pag",

author = "SH Kong and {de Graaf}, G and RF Wolffenbuttel",

note = "CD-ROM; Spring Meeting Optoelectronicsof Group-IV-Based Materials, San Francisco, USA ; Conference date: 21-04-2003 Through 25-04-2003",

year = "2003",

language = "Undefined/Unknown",

isbn = "1-55899-707-5",

publisher = "Materials Research Society",

pages = "1--10",

editor = "T Gregorkiewicz and RG Elliman and PM Fauchet and JA Hutchby",

booktitle = "Optoelectronics of Group-IV-Based Materials",

address = "United States",

}

Integrated silicon infrared microspectrometers. / Kong, SH; de Graaf, G ; Wolffenbuttel, RF.
Optoelectronics of Group-IV-Based Materials. ed. / T Gregorkiewicz; RG Elliman; PM Fauchet; JA Hutchby. Warrendale, USA: Materials Research Society, 2003. p. 1-10.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Integrated silicon infrared microspectrometers

AU - Kong, SH

AU - de Graaf, G

AU - Wolffenbuttel, RF

N1 - CD-ROM

PY - 2003

Y1 - 2003

KW - Elektrotechniek

KW - Techniek

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 1-55899-707-5

SP - 1

EP - 10

BT - Optoelectronics of Group-IV-Based Materials

A2 - Gregorkiewicz, T

A2 - Elliman, RG

A2 - Fauchet, PM

A2 - Hutchby, JA

PB - Materials Research Society

CY - Warrendale, USA

T2 - Spring Meeting Optoelectronicsof Group-IV-Based Materials, San Francisco, USA

Y2 - 21 April 2003 through 25 April 2003

ER -