Integrated silicon: microspectrometers

SH Kong, A Correia, G de Graaf, M Bartek, RF Wolffenbuttel

Research output: Contribution to journalArticleScientificpeer-review

19 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)34-38
Number of pages5
JournalIEEE Instrumentation and Measurement Magazine
Volume4
Issue number3
Publication statusPublished - 2001

Keywords

  • ZX Int.klas.verslagjaar < 2002

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