Integrated transmission lines on high resistivity silicon considering biasing effects

NB Bharatula, S Farris, S Colpo, B Rejaei Salmassi, JN Burghartz

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageUndefined/Unknown
Title of host publicationSAFE 2002 Proceedings of 5th Semiconductor Adances for Future Electronics Workshop
Place of PublicationUtrecht
PublisherSTW Technology Foundation
Pages5-8
Number of pages4
ISBN (Print)90-73461-33-2
Publication statusPublished - 2002
EventSAFE, Veldhoven, NL - Utrecht
Duration: 27 Nov 200228 Nov 2002

Publication series

Name
PublisherSTW Technology Foundation

Conference

ConferenceSAFE, Veldhoven, NL
Period27/11/0228/11/02

Bibliographical note

CD-ROM

Keywords

  • Elektrotechniek
  • Techniek
  • Conf.proc. > 3 pag

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