Integration of a high-NA light microscope in a scanning electron microscope

AC Zonnevylle, RFC van Tol, N Liv, AC Narvaez, APJ Effting, P Kruit, JP Hoogenboom

    Research output: Contribution to journalArticleScientificpeer-review

    55 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)58-70
    Number of pages13
    JournalJournal of Microscopy
    Volume252
    Issue number1
    Publication statusPublished - 2013

    Keywords

    • CWTS 0.75 <= JFIS < 2.00

    Cite this