Integration of a high-NA light microscope in a scanning electron microscope

AC Zonnevylle, RFC van Tol, N Liv, AC Narvaez, APJ Effting, P Kruit, JP Hoogenboom

Research output: Contribution to journal › Article › Scientific › peer-review

Keywords

@article{d5b2b7f5ecb8468daa161fee40b5a093,

title = "Integration of a high-NA light microscope in a scanning electron microscope",

keywords = "CWTS 0.75 <= JFIS < 2.00",

author = "AC Zonnevylle and {van Tol}, RFC and N Liv and AC Narvaez and APJ Effting and P Kruit and JP Hoogenboom",

year = "2013",

language = "Undefined/Unknown",

volume = "252",

pages = "58--70",

journal = "Journal of Microscopy",

issn = "0022-2720",

publisher = "Blackwell",

number = "1",

}

TY - JOUR

T1 - Integration of a high-NA light microscope in a scanning electron microscope

AU - Zonnevylle, AC

AU - van Tol, RFC

AU - Liv, N

AU - Narvaez, AC

AU - Effting, APJ

AU - Kruit, P

AU - Hoogenboom, JP

PY - 2013

Y1 - 2013

KW - CWTS 0.75 <= JFIS < 2.00

M3 - Article

SN - 0022-2720

VL - 252

SP - 58

EP - 70

JO - Journal of Microscopy

JF - Journal of Microscopy

IS - 1

ER -