Interface Characterization and Failure Modeling for Semiconductor Application

A Xiao

Research output: ThesisDissertation (TU Delft)

Original languageEnglish
QualificationDoctor of Philosophy
Awarding Institution
  • Delft University of Technology
  • Ernst, Leo, Supervisor
  • Jansen, K.M.B., Advisor
  • Zhang, G.Q., Advisor
  • Dasgupta, A., Advisor, External person
  • Wunderle, B, Advisor, External person
  • Yang, DG, Advisor, External person
  • Pape, H, Advisor, External person
  • van Keulen, A., Advisor
Award date30 Nov 2012
Place of PublicationEnschede
Print ISBNs978-94-91104-12-1
Publication statusPublished - 2012


  • authored books
  • Diss. prom. aan TU Delft

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