Interfacial Failure Characterization of Electronic Packaging Component Using a Multiscale Modelling Approach

Zhen Cui, Yingying Zhang, Qun Yang, Guoqi Zhang, Xianping Chen*

*Corresponding author for this work

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

1 Citation (Scopus)
52 Downloads (Pure)

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