Interfacial force measurements using atomic force microscopy

Liangyong Chu

Research output: ThesisDissertation (TU Delft)

18 Downloads (Pure)

Abstract

Atomic Force Microscopy (AFM) can not only image the topography of surfaces at atomic resolution, but can also measure accurately the different interaction forces, like repulsive, adhesive and lateral existing between an AFM tip and the sample surface. Based on AFM, various extended techniques have been developed such as colloidal probe AFM, single molecule AFM, bio-AFM, Kalvin probe AFM and lateral force AFM (LFM). Together,these make AFM a powerful tool to study the properties of surfaces and interfaces, which is of great importance for many different disciplines, e.g. surface chemistry, polymerchemistry and physics, solid-state physics, cell biology and medicine.
Original languageEnglish
Awarding Institution
  • Delft University of Technology
Supervisors/Advisors
  • Sudhölter, E.J.R., Supervisor
  • Picken, S.J., Supervisor
Award date8 Jan 2018
Print ISBNs978-94-6332-297-3
DOIs
Publication statusPublished - 23 Dec 2017

Keywords

  • Atomic Force Microscopy (AFM)
  • Force measurements
  • Graphene oxide
  • Silica

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