Interpretation of dynamic resistance results of on-load tap changers

JJ Erbrink, E Gulski, JJ Smit, R Leich, PP Seitz, B Quak

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	International conference on condition monitoring and diagnosis
Editors	s.n.
Place of Publication	Tokyo, Japan
Publisher	IEEE
Pages	1-5
Number of pages	5
ISBN (Print)	978-1-4244-6298-8
Publication status	Published - 2010
Event	International conference on condition monitoring and diagnosis, Tokyo, Japan - Tokyo, Japan Duration: 6 Sept 2010 → 11 Sept 2010

Name
Publisher	IEEE

Conference	International conference on condition monitoring and diagnosis, Tokyo, Japan
Period	6/09/10 → 11/09/10

Keywords

@inproceedings{b03f48d09f5d44098a8bf57d96973ef5,

title = "Interpretation of dynamic resistance results of on-load tap changers",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "JJ Erbrink and E Gulski and JJ Smit and R Leich and PP Seitz and B Quak",

year = "2010",

language = "English",

isbn = "978-1-4244-6298-8",

publisher = "IEEE",

pages = "1--5",

editor = "s.n.",

booktitle = "International conference on condition monitoring and diagnosis",

address = "United States",

note = "International conference on condition monitoring and diagnosis, Tokyo, Japan ; Conference date: 06-09-2010 Through 11-09-2010",

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TY - GEN

T1 - Interpretation of dynamic resistance results of on-load tap changers

AU - Erbrink, JJ

AU - Gulski, E

AU - Smit, JJ

AU - Leich, R

AU - Seitz, PP

AU - Quak, B

PY - 2010

Y1 - 2010

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 978-1-4244-6298-8

SP - 1

EP - 5

BT - International conference on condition monitoring and diagnosis

A2 - s.n., null

PB - IEEE

CY - Tokyo, Japan

T2 - International conference on condition monitoring and diagnosis, Tokyo, Japan

Y2 - 6 September 2010 through 11 September 2010

ER -