Inverse wave theory-based algorithms for the ultrasonic inspection of thin laminated materials, based on reflection measurements

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	Computer Methods and Inverse Problems in Nondestructive Testing and Diagnostics
Editors	GV Vengrinovich, R Tillack
Pages	539-546
Number of pages	8
Publication status	Published - 1998

Cite this

@inproceedings{33010fa812774bc9b166cacbcc5b2ffe,

title = "Inverse wave theory-based algorithms for the ultrasonic inspection of thin laminated materials, based on reflection measurements",

author = "J Vos and CPA Wapenaar and DJ Verschuur",

year = "1998",

language = "Undefined/Unknown",

isbn = "3931381250",

pages = "539--546",

editor = "GV Vengrinovich and R Tillack",

booktitle = "Computer Methods and Inverse Problems in Nondestructive Testing and Diagnostics",

}

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

TY - GEN

T1 - Inverse wave theory-based algorithms for the ultrasonic inspection of thin laminated materials, based on reflection measurements

AU - Vos, J

AU - Wapenaar, CPA

AU - Verschuur, DJ

PY - 1998

Y1 - 1998

M3 - Conference contribution

SN - 3931381250

SP - 539

EP - 546

BT - Computer Methods and Inverse Problems in Nondestructive Testing and Diagnostics

A2 - Vengrinovich, GV

A2 - Tillack, R

ER -