Investigating a specific class of software reliability growth models

PA Keiller; TA Mazzuchi

Investigating a specific class of software reliability growth models

PA Keiller, TA Mazzuchi

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

4 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	2002 Proceedings Annual Reliability and Maintainability Symposium
Place of Publication	Piscataway, NJ. USA
Publisher	IEEE Society
Pages	242-248
Number of pages	7
ISBN (Print)	0-7803-7348-0
Publication status	Published - 2002
Event	2002 Proceedings Annual Reliability and Maintainability Symposium - Piscataway, NJ. USA Duration: 28 Jan 2002 → 31 Jan 2002

Publication series

Name
Publisher	IEEE

Conference

Conference	2002 Proceedings Annual Reliability and Maintainability Symposium
Period	28/01/02 → 31/01/02

Keywords

Wiskunde en Informatica
Techniek
technische Wiskunde en Informatica
conference contrib. refereed
Conf.proc. > 3 pag
ZX Int.klas.verslagjaar < 2002

Cite this

@inproceedings{bba8b008999746c29fedb80f8da6bf9f,

title = "Investigating a specific class of software reliability growth models",

keywords = "Wiskunde en Informatica, Techniek, technische Wiskunde en Informatica, conference contrib. refereed, Conf.proc. > 3 pag, ZX Int.klas.verslagjaar < 2002",

author = "PA Keiller and TA Mazzuchi",

year = "2002",

language = "Undefined/Unknown",

isbn = "0-7803-7348-0",

publisher = "IEEE Society",

pages = "242--248",

booktitle = "2002 Proceedings Annual Reliability and Maintainability Symposium",

note = "null ; Conference date: 28-01-2002 Through 31-01-2002",

}

TY - GEN

T1 - Investigating a specific class of software reliability growth models

AU - Keiller, PA

AU - Mazzuchi, TA

PY - 2002

Y1 - 2002

KW - Wiskunde en Informatica

KW - Techniek

KW - technische Wiskunde en Informatica

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SN - 0-7803-7348-0

SP - 242

EP - 248

BT - 2002 Proceedings Annual Reliability and Maintainability Symposium

PB - IEEE Society

CY - Piscataway, NJ. USA

Y2 - 28 January 2002 through 31 January 2002

ER -