Fingerprint
Dive into the research topics of 'Investigation of error- and drift sources in a capacitive sensor system for sub-nanometer displacement measurement'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Investigation of error- and drift sources in a capacitive sensor system for sub-nanometer displacement measurement
Roumen Nojdelova, D Voigt, Arthur van de Nes, S Nihtianov
Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
1
Citation
(Scopus)