Investigation of "fur-like" residues post dry etching of polyimide using aluminum hard etch mask

Shivani Joshi, Angel Savov, Salman Shafqat, Ronald Dekker

Research output: Contribution to journalArticleScientificpeer-review

6 Citations (Scopus)
418 Downloads (Pure)

Abstract

The authors found that oxygen plasma etching of polyimide (PI) with aluminum (Al) as a hard-etch mask results in lightly textured arbitrary shaped “fur-like” residues. Upon investigation, the presence of Al was detected in these residues. Ruling out several causes of metal contamination that were already reported in literature, a new theory for the presence of the metal containing residues is described. Furthermore, different methods for the residue free etching of PI using an Al hard-etch by using different metal deposition and patterning methods are explored. A fur-free procedure for the etching of PI using a one step-reactive ion etch of the metal hard-etch mask is presented.
Original languageEnglish
Pages (from-to)130-135
Number of pages6
JournalMaterials Science in Semiconductor Processing
Volume75
DOIs
Publication statusPublished - 2018

Bibliographical note

Accepted author manuscript

Keywords

  • Polymers
  • Reactive ion etching
  • Sputtering
  • Residues
  • PI residues

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