Investigation of local electrical properties of coincidence-site-lattice boundaries in location-controlled silicon islands using scanning capacitance microscopy

N Matsuki, R Ishihara, A Baiano, CIM Beenakker

Research output: Contribution to journalArticleScientificpeer-review

17 Citations (Scopus)
Original languageUndefined/Unknown
JournalApplied Physics Letters
Volume93
Publication statusPublished - 2008

Keywords

  • academic journal papers
  • CWTS JFIS >= 2.00

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