Investigation of local electrical properties of coincidence-site-lattice boundaries in location-controlled silicon islands using scanning capacitance microscopy

N Matsuki; R Ishihara; A Baiano; CIM Beenakker

Investigation of local electrical properties of coincidence-site-lattice boundaries in location-controlled silicon islands using scanning capacitance microscopy

N Matsuki, R Ishihara, A Baiano, CIM Beenakker

Electronic Components, Technology and Materials

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Journal	Applied Physics Letters
Volume	93
Publication status	Published - 2008

Keywords

academic journal papers
CWTS JFIS >= 2.00

Cite this

@article{fc33eec114a34496b4a8c8f0e0365288,

title = "Investigation of local electrical properties of coincidence-site-lattice boundaries in location-controlled silicon islands using scanning capacitance microscopy",

keywords = "academic journal papers, CWTS JFIS >= 2.00",

author = "N Matsuki and R Ishihara and A Baiano and CIM Beenakker",

year = "2008",

language = "Undefined/Unknown",

volume = "93",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

}

TY - JOUR

T1 - Investigation of local electrical properties of coincidence-site-lattice boundaries in location-controlled silicon islands using scanning capacitance microscopy

AU - Matsuki, N

AU - Ishihara, R

AU - Baiano, A

AU - Beenakker, CIM

PY - 2008

Y1 - 2008

KW - academic journal papers

KW - CWTS JFIS >= 2.00

M3 - Article

SN - 0003-6951

VL - 93

JO - Applied Physics Letters

JF - Applied Physics Letters

ER -