Investigation of long-term drift of NTC temperature sensors with less than 1 mK uncertainty

A Kulkarni; M Patrascu; Y Van de Vijver; J Van Wensveen; R Pijnenburg; S Nihtianov

doi:10.1109/ISIE.2015.7281460

Investigation of long-term drift of NTC temperature sensors with less than 1 mK uncertainty

A Kulkarni, M Patrascu, Y Van de Vijver, J Van Wensveen, R Pijnenburg, S Nihtianov

Electronic Instrumentation

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

4 Citations (Scopus)

Original language	English
Title of host publication	Proceedings - 2015 IEEE 24th International Symposium on Industrial Electronics
Editors	W Suemitsu, C Couto
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE Society
Pages	150-155
Number of pages	6
ISBN (Print)	978-1-4673-7554-2
DOIs	https://doi.org/10.1109/ISIE.2015.7281460
Publication status	Published - 2015
Event	IEEE ISIE 2015, Buzios, Brazil - Piscataway, NJ, USA Duration: 3 Jun 2015 → 5 Jun 2015

Publication series

Name
Publisher	IEEE

Conference

Conference	IEEE ISIE 2015, Buzios, Brazil
Period	3/06/15 → 5/06/15

Bibliographical note

Harvest

Access to Document

10.1109/ISIE.2015.7281460

Cite this

Kulkarni, A., Patrascu, M., Van de Vijver, Y., Van Wensveen, J., Pijnenburg, R., & Nihtianov, S. (2015). Investigation of long-term drift of NTC temperature sensors with less than 1 mK uncertainty. In W. Suemitsu, & C. Couto (Eds.), Proceedings - 2015 IEEE 24th International Symposium on Industrial Electronics (pp. 150-155). IEEE Society. https://doi.org/10.1109/ISIE.2015.7281460

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title = "Investigation of long-term drift of NTC temperature sensors with less than 1 mK uncertainty",

author = "A Kulkarni and M Patrascu and {Van de Vijver}, Y and {Van Wensveen}, J and R Pijnenburg and S Nihtianov",

note = "Harvest; IEEE ISIE 2015, Buzios, Brazil ; Conference date: 03-06-2015 Through 05-06-2015",

year = "2015",

doi = "10.1109/ISIE.2015.7281460",

language = "English",

isbn = "978-1-4673-7554-2",

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}

Kulkarni, A, Patrascu, M, Van de Vijver, Y, Van Wensveen, J, Pijnenburg, R & Nihtianov, S 2015, Investigation of long-term drift of NTC temperature sensors with less than 1 mK uncertainty. in W Suemitsu & C Couto (eds), Proceedings - 2015 IEEE 24th International Symposium on Industrial Electronics. IEEE Society, Piscataway, NJ, USA, pp. 150-155, IEEE ISIE 2015, Buzios, Brazil, 3/06/15. https://doi.org/10.1109/ISIE.2015.7281460

Investigation of long-term drift of NTC temperature sensors with less than 1 mK uncertainty. / Kulkarni, A; Patrascu, M; Van de Vijver, Y et al.
Proceedings - 2015 IEEE 24th International Symposium on Industrial Electronics. ed. / W Suemitsu; C Couto. Piscataway, NJ, USA: IEEE Society, 2015. p. 150-155.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Investigation of long-term drift of NTC temperature sensors with less than 1 mK uncertainty

AU - Kulkarni, A

AU - Patrascu, M

AU - Van de Vijver, Y

AU - Van Wensveen, J

AU - Pijnenburg, R

AU - Nihtianov, S

N1 - Harvest

PY - 2015

Y1 - 2015

U2 - 10.1109/ISIE.2015.7281460

DO - 10.1109/ISIE.2015.7281460

M3 - Conference contribution

SN - 978-1-4673-7554-2

SP - 150

EP - 155

BT - Proceedings - 2015 IEEE 24th International Symposium on Industrial Electronics

A2 - Suemitsu, W

A2 - Couto, C

PB - IEEE Society

CY - Piscataway, NJ, USA

T2 - IEEE ISIE 2015, Buzios, Brazil

Y2 - 3 June 2015 through 5 June 2015

ER -

Kulkarni A, Patrascu M, Van de Vijver Y, Van Wensveen J, Pijnenburg R, Nihtianov S. Investigation of long-term drift of NTC temperature sensors with less than 1 mK uncertainty. In Suemitsu W, Couto C, editors, Proceedings - 2015 IEEE 24th International Symposium on Industrial Electronics. Piscataway, NJ, USA: IEEE Society. 2015. p. 150-155 doi: 10.1109/ISIE.2015.7281460