Investigation of long-term drift of NTC temperature sensors with less than 1 mK uncertainty

A Kulkarni, M Patrascu, Y Van de Vijver, J Van Wensveen, R Pijnenburg, S Nihtianov

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

1 Citation (Scopus)
Original languageEnglish
Title of host publicationProceedings - 2015 IEEE 24th International Symposium on Industrial Electronics
EditorsW Suemitsu, C Couto
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages150-155
Number of pages6
ISBN (Print)978-1-4673-7554-2
DOIs
Publication statusPublished - 2015
EventIEEE ISIE 2015, Buzios, Brazil - Piscataway, NJ, USA
Duration: 3 Jun 20155 Jun 2015

Publication series

Name
PublisherIEEE

Conference

ConferenceIEEE ISIE 2015, Buzios, Brazil
Period3/06/155/06/15

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