Investigation of lumen degradation mechanisms of mid-power LED by HAST

J Huang; SW Koh; X Li; GQ Zhang

doi:10.1109/ICEPT.2014.6922925

Investigation of lumen degradation mechanisms of mid-power LED by HAST

J Huang, SW Koh, X Li, GQ Zhang

Electronic Components, Technology and Materials

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

2 Citations (Scopus)

Original language	English
Title of host publication	Proceedings of the 15th International Conference on Electronic Packaging Technology
Editors	K Bi, Z Tian, Z Xu
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE Society
Pages	1437-1441
Number of pages	5
ISBN (Print)	978-147994707-2
DOIs	https://doi.org/10.1109/ICEPT.2014.6922925
Publication status	Published - 2014
Event	ICEPT 2014, Chengdu, China - Piscatawa, NJ, USA Duration: 12 Aug 2014 → 15 Aug 2014

Publication series

Name
Publisher	IEEE

Conference

Conference	ICEPT 2014, Chengdu, China
Period	12/08/14 → 15/08/14

Bibliographical note

Harvest

Access to Document

10.1109/ICEPT.2014.6922925

Cite this

@inproceedings{0cb57df0bd8e49ceb3403cc9b645ba6e,

title = "Investigation of lumen degradation mechanisms of mid-power LED by HAST",

author = "J Huang and SW Koh and X Li and GQ Zhang",

note = "Harvest; ICEPT 2014, Chengdu, China ; Conference date: 12-08-2014 Through 15-08-2014",

year = "2014",

doi = "10.1109/ICEPT.2014.6922925",

language = "English",

isbn = "978-147994707-2",

publisher = "IEEE Society",

pages = "1437--1441",

editor = "K Bi and Z Tian and Z Xu",

booktitle = "Proceedings of the 15th International Conference on Electronic Packaging Technology",

}

Investigation of lumen degradation mechanisms of mid-power LED by HAST. / Huang, J; Koh, SW; Li, X et al.
Proceedings of the 15th International Conference on Electronic Packaging Technology. ed. / K Bi; Z Tian; Z Xu. Piscataway, NJ, USA: IEEE Society, 2014. p. 1437-1441.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Investigation of lumen degradation mechanisms of mid-power LED by HAST

AU - Huang, J

AU - Koh, SW

AU - Li, X

AU - Zhang, GQ

N1 - Harvest

PY - 2014

Y1 - 2014

U2 - 10.1109/ICEPT.2014.6922925

DO - 10.1109/ICEPT.2014.6922925

M3 - Conference contribution

SN - 978-147994707-2

SP - 1437

EP - 1441

BT - Proceedings of the 15th International Conference on Electronic Packaging Technology

A2 - Bi, K

A2 - Tian, Z

A2 - Xu, Z

PB - IEEE Society

CY - Piscataway, NJ, USA

T2 - ICEPT 2014, Chengdu, China

Y2 - 12 August 2014 through 15 August 2014

ER -