Investigation of PD occurrence and detectability in high voltage power cable accessories

P Cichecki; JS Ayan; E Gulski; JJ Smit; LA Chmura

Investigation of PD occurrence and detectability in high voltage power cable accessories

P Cichecki, JS Ayan, E Gulski, JJ Smit, LA Chmura

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

4 Citations (Scopus)

Original language	English
Title of host publication	2010 International Conference on High Voltage Engineering of Application
Editors	s.n.
Place of Publication	New Orleans
Publisher	IEEE Society
Pages	264-267
Number of pages	4
ISBN (Print)	978-1-4244-8285-6/10
Publication status	Published - 2010
Event	2010 International Conference on High Voltage Engineering and Application - New Orleans Duration: 11 Oct 2010 → 14 Oct 2010

Publication series

Name
Publisher	IEEE

Conference

Conference	2010 International Conference on High Voltage Engineering and Application
Period	11/10/10 → 14/10/10

Keywords

conference contrib. refereed
Conf.proc. > 3 pag

Cite this

@inproceedings{a9421fbccec149918c967273d7a4ee07,

title = "Investigation of PD occurrence and detectability in high voltage power cable accessories",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "P Cichecki and JS Ayan and E Gulski and JJ Smit and LA Chmura",

year = "2010",

language = "English",

isbn = "978-1-4244-8285-6/10",

publisher = "IEEE Society",

pages = "264--267",

editor = "s.n.",

booktitle = "2010 International Conference on High Voltage Engineering of Application",

note = "2010 International Conference on High Voltage Engineering and Application ; Conference date: 11-10-2010 Through 14-10-2010",

}

Investigation of PD occurrence and detectability in high voltage power cable accessories. / Cichecki, P; Ayan, JS; Gulski, E et al.
2010 International Conference on High Voltage Engineering of Application. ed. / s.n. New Orleans: IEEE Society, 2010. p. 264-267.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Investigation of PD occurrence and detectability in high voltage power cable accessories

AU - Cichecki, P

AU - Ayan, JS

AU - Gulski, E

AU - Smit, JJ

AU - Chmura, LA

PY - 2010

Y1 - 2010

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 978-1-4244-8285-6/10

SP - 264

EP - 267

BT - 2010 International Conference on High Voltage Engineering of Application

A2 - s.n., null

PB - IEEE Society

CY - New Orleans

T2 - 2010 International Conference on High Voltage Engineering and Application

Y2 - 11 October 2010 through 14 October 2010

ER -