Investigation on flip chip solder joint fatigue with cure-dependent underfill properties

DG Yang, GQ Zhang, LJ Ernst, C van t Hof, JFJM Caers, HJL Bressers, JHJ Janssen

Research output: Contribution to journalArticleScientificpeer-review

24 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)388-398
Number of pages11
JournalIEEE Transactions on Components and Packaging Technology
Volume26
Issue number2
Publication statusPublished - 2003

Keywords

  • ZX CWTS JFIS < 1.00

Cite this