Ion-induced interface layer formation in W/Si and WRe/Si multilayers

MJH Kessels, J Verhoeven, FD Tichelaar, F Bijkerk

    Research output: Contribution to journalArticleScientificpeer-review

    10 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)227-234
    Number of pages8
    JournalSurface Science
    Volume582
    Issue number1-3
    Publication statusPublished - 2005

    Keywords

    • academic journal papers
    • ZX CWTS JFIS < 1.00

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